Publications

2013
DOI
[bibtex]
Yan Zhang, Xin Chen, Sriram Sankaranarayanan, Fabio Somenzi, Erika Abraham. From Statistical Model Checking to Statistical Model Inference: Characterizing the Effect of Process Variations in Analog Circuits. Proc. of the 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD'13), pages 662–669, IEEE, 2013.